Thin film Chemical analysis using ion beams: risks and opportunities
Thursday, 30 January, 2020
Robertino Zanoni is glad to invite you at the department seminar:
Thin film Chemical analysis using ion beams: risks and opportunities
by
Dr. Damien Aureau
CNRS
Lavoisier Institute of the University of Versailles
Francia
Seminar will be held on February 2020 at 12.00 in room 24, fouth floor, Edificio Caglioti buoilding (Cu014).